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العنوان
Surface scattering spectroscopy of solid films /
المؤلف
Negm, Sohair Elsayed Mahmoud.
هيئة الاعداد
مشرف / سهير السيد محمود نجم
مشرف / حسن طلعت
مشرف / حسن طلعت
مشرف / حسن طلعت
الموضوع
Surface chemistry. Interfaces Physical sciences. Scattering spectroscopy.
تاريخ النشر
1986.
عدد الصفحات
167 p.:
اللغة
الإنجليزية
الدرجة
الدكتوراه
التخصص
الهندسة
تاريخ الإجازة
1/1/1986
مكان الإجازة
جامعة الزقازيق - كلية الهندسة - Sciences Natural
الفهرس
Only 14 pages are availabe for public view

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Abstract

We have employed three types of surface spectroscopy to study surface plasmons or surface electromagnetic (SEM) waves in silver (AG)films of different thickness in the range of 300-1000 A. We have employed the kretschmann configuration of attenuated total reflection(ATR) foe coupling volume and surface (EM)waves. The incident radiations were Helium-Neon and Argon lasers.
Using th first spectroscopic measurements which are the back scattering (reflection) ATR method, we were able to detect the complex dielectric constant of the films as well as the dispersion relation of the surface plasmons in the Ag films.
The second spectroscopy technique used as the forward scattering angular spectroscopy of surface EM waves in the same metal films, we arrived at the corresponding surface roughness wave vectors responsible for the observation of the forward scattered light.
The third spectroscopic technique used is the photoacoustic (PA) ATR combined angular spectroscopy where we measured the nonradiative decacy or the intrinsic absorption of the surface plasmons in the same films. Using the half widths of the resulting lorentzian shapes or resonance curves in the three spectroscopies, We arrived at the relations of the different decay processes in the three spectroscopic methods.
Finally, We applied the above three surface spectroscopy ATR ,SL and PA-ATR to a monolayer of a dye rodomine 6G deposited on the Ag films and compare the sensitivities of the three techniques in the detection of the added layer.