الفهرس | Only 14 pages are availabe for public view |
Abstract Accurate determination of the refractive index profile in an integrated optical component and its dependence on the fabrication parameters is a mandatory process required for both the understanding of the component behaviour as well as its possible industrialization. In this work, we are focusing on the determination of the refractive index profile in waveguides fabricated by the ionic exchange on a glass substrate. A detailed study of the ionic exchange process with a comprehensive survey on the refractive index measurement techniques are thus presented in the thesis. Examining the different techniques, we found that the Mslines experiment is the most common and powerful technique for this purpose. However it suffers from the lack of number of points on the index profile, which is Limited by the number of modes in the tested guide. This also means that the method is restricted for multimode operation and that its accuracy is enhanced with the increase of the number of modes to overcome this problem. We proposed the NM-lines technique based on the successive glass etching and repeated M-lines after each etching step, to increase the number of points and as a result improve the method accuracy, especially for guides with limited number of modes. In addition, we extended the method for even single mode operation in guides with Gaussian profile. The experimental measurements carried out on different samples fabricated in the lab show that the proposed technique improves accuracy of measurement. Key words: Ion Exchange - Single mode Waveguides - Characterization - Waveguides. |