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العنوان
Refractive Indee Profile Determination for Intregrated Opric Application
الناشر
: Michel Monir Mossad
المؤلف
Gad , Michel Monir Mossad
هيئة الاعداد
باحث / ميخائيل منير مسعد جاد
مشرف / عمر عبد الحليم عمر
مشرف / ضياء عبد المجيد خليل
مناقش / محمود حنفى احمد
مناقش / كامل محمد محمود حسن
تاريخ النشر
, 2006
عدد الصفحات
xi , 30p
اللغة
الإنجليزية
الدرجة
ماجستير
التخصص
الهندسة (متفرقات)
تاريخ الإجازة
1/1/2006
مكان الإجازة
جامعة عين شمس - كلية الهندسة - فيزيا ورياضيات
الفهرس
Only 14 pages are availabe for public view

from 172

from 172

Abstract

Accurate determination of the refractive index profile in an
integrated optical component and its dependence on the fabrication
parameters is a mandatory process required for both the
understanding of the component behaviour as well as its possible
industrialization. In this work, we are focusing on the determination
of the refractive index profile in waveguides fabricated by the ionic
exchange on a glass substrate. A detailed study of the ionic exchange
process with a comprehensive survey on the refractive index
measurement techniques are thus presented in the thesis. Examining
the different techniques, we found that the Mslines experiment is the
most common and powerful technique for this purpose. However it
suffers from the lack of number of points on the index profile, which
is Limited by the number of modes in the tested guide. This also
means that the method is restricted for multimode operation and that
its accuracy is enhanced with the increase of the number of modes to
overcome this problem. We proposed the NM-lines technique based
on the successive glass etching and repeated M-lines after each etching step, to increase the number of points and as a result improve
the method accuracy, especially for guides with limited number of
modes. In addition, we extended the method for even single mode
operation in guides with Gaussian profile. The experimental
measurements carried out on different samples fabricated in the lab
show that the proposed technique improves accuracy of
measurement.
Key words: Ion Exchange - Single mode Waveguides -
Characterization - Waveguides.